The Universal Test Fixture Mainframe is ideal for Multi-port measurement.
The elegant and versatile base unit can accept up to 6 ports in a variety of RF launches.
Drop-in Calibration standards are available for Calibration.
Features:
Universal Application for FET-Chips, Bipolar-Chips, MMIC-Chips, Packaged Transistors, Surface Mount Devices, etc.
Ideal for S-parameter measurements
De-embedding with TRL Calibration Standards
Excellent RF specifications
Excellent Repeatability
Both RF-launch positions adjustable in y and z-axis
Optional Transition Assemblies Available
Mainframes provide a highly flexible platform for making microwave measurements up to 40 GHz. The fixture comes with different transition assemblies to accommodate different frequency bands and environments. Midsection adapters are designed to be used in the Mainframe to create a custom interface for each package outline. These Midsections provide accurate, repeatable positioning of the device for making measurements in either an R&D or production environment. Calibration Kits can be used to de-embed the Mainframe and Midsection Adapter from the measurement results to allow accurate data to be taken of the Device Under Test. |
| Universal Test Fixture Mainframe |
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Item Shown:
5.) Mainframe Capacitor and Inductor testing
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